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  • Evènements à venir

2010 IEEE IRPS
Anaheim, California USA
May 2-6, 2010
Site Internet des salons

LED Tech Korea 2010 & Optical Expo 2010
Seoul, Korea
May 12-14, 2010
Site Internet des salons

NSLS Users’ Meeting
Brookhaven National Laboratory
Upton, NY
May 24-26, 2010
Site Internet des salons

2010 IEEE Photovoltaic Specialists Conference
Honolulu, Hawaii
June 21-24, 2010
Site Internet des salons

UGIM 2010 Symposium
Purdue University
West Lafayette, IN
June 28-July 1, 2010
Site Internet des salons

2010 Intersolar North America
San Franciso, CA
July 13-15, 2010
Site Internet des salons

MATELEC
Madrid, Spain
October 26-29, 2010
Site Internet des salons


Optoélectronique

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Keithley offers a wide range of test solutions for companies developing and manufacturing optoelectronic components and subassemblies for telecommunications, data communications, high performance illumination, and other optical applications. Keithley test products deliver speed, resolution, and accuracy – critical for making quick and informed decisions related to product design, production yield, process monitoring, specification claims, and calibration data. The results are lower manufacturing costs, improved product quality, and shorter time-to-market through improved testing of laser diodes, photo diodes, optical amplifiers, LEDs, CD/DVD lasers, and other active optoelectronic devices. Keithley’s integrated solutions combine SourceMeter® instruments, sensitive multi-channel current meters, temperature controllers, optical switching, integrating spheres, and related test equipment for full device testing and characterization. These solutions are scalable from single-channel instruments through high-density card/chassis systems. They all provide excellent ROI in high throughput parallel test environments, and when testing multi-section devices such as tunable lasers.