Focus Solutions
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- Condensateurs - Capacité, charge, courant faible, tension disruptive
- Modélisation des dispositifs - Acquisition de données et extraction de paramètres
- Diodes - Tension disruptive forte, courbes courant-tension
- Dispositifs nanoélectroniques - Caractérisation C-V
- Dispositifs nanoélectroniques - Mesures faible résistance
- Dispositifs nanoélectroniques - Courbes I-V électroniques moléculaires et nanoélectroniques
- Résistances - Dynamique étendue, grande précision des essais, mesures rapides
- Transistors - Mesures C-V et I-V
- Condensateurs - Capacité, charge, courant faible, tension disruptive
- Products
- Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- System 82-WIN Simultaneous C-V System for Windows
- Modélisation des dispositifs - Acquisition de données et extraction de paramètres
- Products
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Diodes - Tension disruptive forte, courbes courant-tension
- Products
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output
- Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output
- Model 2425 100W SourceMeter w/ Measurements up to 100V and 3A
- Model 2430 1kW Pulse Mode SourceMeter w/ Measurements up to 100V and 10A
- Model 2440 5A SourceMeter w/ Measurements up to 40V and 5A, 50W Power Output
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Model 6430 Sub-Femtoamp Remote SourceMeter
- Dispositifs nanoélectroniques - Caractérisation C-V
- Products
- Dispositifs nanoélectroniques - Mesures faible résistance
- Products
- Model 2001 High-Performance, 7-1/2-Digit DMM w/ 8k Memory
- Model 2002 High-Performance, 8-1/2-Digit DMM w/ 8k Memory
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Dispositifs nanoélectroniques - Courbes I-V électroniques moléculaires et nanoélectroniques
- Products
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Model 6430 Sub-Femtoamp Remote SourceMeter
- Résistances - Dynamique étendue, grande précision des essais, mesures rapides
- Products
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output
- Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output
- Model 2425 100W SourceMeter w/ Measurements up to 100V and 3A
- Model 2430 1kW Pulse Mode SourceMeter w/ Measurements up to 100V and 10A
- Model 2440 5A SourceMeter w/ Measurements up to 40V and 5A, 50W Power Output
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Model 6430 Sub-Femtoamp Remote SourceMeter
- Transistors - Mesures C-V et I-V
- Products
- Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output
- Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- System 82-WIN Simultaneous C-V System for Windows