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- Matériaux d'interconnexion/conducteur - Mesures courant faible
- Matériaux d'interconnexion/conducteur - Mesures faible résistance et capacité
- Matériaux diélectriques - Courant faible, tension disruptive, caractérisation de la charge
- Isolants - Mesures de résistance élevée
- Semi-conducteurs - Mesures de la résistivité
- Semiconducteurs - Test de fiabilité sous contraintes
- Supraconducteurs - Mesures rapides à faible bruit des faibles résistances
- Matériaux d'interconnexion/conducteur - Mesures courant faible
- Products
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Matériaux d'interconnexion/conducteur - Mesures faible résistance et capacité
- Products
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output
- Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output
- Model 2425 100W SourceMeter w/ Measurements up to 100V and 3A
- Model 2430 1kW Pulse Mode SourceMeter w/ Measurements up to 100V and 10A
- Model 2440 5A SourceMeter w/ Measurements up to 40V and 5A, 50W Power Output
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Model 6430 Sub-Femtoamp Remote SourceMeter
- Matériaux diélectriques - Courant faible, tension disruptive, caractérisation de la charge
- Products
- Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Model 6430 Sub-Femtoamp Remote SourceMeter
- Isolants - Mesures de résistance élevée
- Products
- Model 6430 Sub-Femtoamp Remote SourceMeter
- Semi-conducteurs - Mesures de la résistivité
- Products
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Semiconducteurs - Test de fiabilité sous contraintes
- Products
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Model 707A 6-Slot, Switching Matrix w/ up to 576 Crosspoints
- Model 7174A 8x12, Low-Current, High-Speed Matrix Card (for Models 707A and 708A)
- Supraconducteurs - Mesures rapides à faible bruit des faibles résistances
- Products
- Model 1801 Nanovolt Preamp (for Model 2001 and 2002)
- Model 2001 High-Performance, 7-1/2-Digit DMM w/ 8k Memory
- Model 2002 High-Performance, 8-1/2-Digit DMM w/ 8k Memory
- Model 2510 TEC SourceMeter