Semiconducteurs - Test de fiabilité sous contraintes
Document Actions
- Products
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Model 707A 6-Slot, Switching Matrix w/ up to 576 Crosspoints
- Model 7174A 8x12, Low-Current, High-Speed Matrix Card (for Models 707A and 708A)