Focus Solutions
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- Réception tranche terminale - Transistors (Vt), diodes, condensateurs, résistances, temps de propagation
- Qualification des équipements - Fréquence des défauts
- Porte/poly - MOSCAP GOI, ECD, Vt
- Métal-2 - Contrôle des contacts, électromigration, EWR
- Nouvelles technologies - HF/CC, SOC, FeRAM, MRAMS, LCD-TEG
- Réception tranche terminale - Transistors (Vt), diodes, condensateurs, résistances, temps de propagation
- Products
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- S400DC/RF Single-insertion RF and DC Test Solution
- Qualification des équipements - Fréquence des défauts
- Products
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- S400DC/RF Single-insertion RF and DC Test Solution
- Porte/poly - MOSCAP GOI, ECD, Vt
- Products
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- S600 Series Parametric Test Systems
- S400DC/RF Single-insertion RF and DC Test Solution
- Métal-2 - Contrôle des contacts, électromigration, EWR
- Products
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- S400DC/RF Single-insertion RF and DC Test Solution
- Nouvelles technologies - HF/CC, SOC, FeRAM, MRAMS, LCD-TEG
- Products
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- S600 Series Parametric Test Systems
- S400DC/RF Single-insertion RF and DC Test Solution