| Model 4200-SCS Parameter Analyzer |
| Part Number
: 4200-SCS |
Les prix en EURO indiqués sont valables pour les références produits achetés en ligne, exclusivement en France. Aucune ré-exportation n'est autorisée sans l'accord préalable écrit de Keithley Instruments.
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The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests as well as provide precision measurement and high resolution with LCR meter support.
Optional Instrumentation: Ultra-Fast I-V Application Package: |
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- Intuitive, point-and-click Windows®-based environment
- Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
- C-V instrument makes C-V measurements as easy as DC I-V
- Pulse and pulse I-V capabilities for advanced semiconductor testing
- Scope card provides integrated scope and pulse measure functionality
- Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
- Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control
- Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC compliant sample tests
- Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
- Includes software drivers for leading analytical probers
Product Intro
Product Tour
Product Demo
- Semiconductor Devices
- - On-wafer parametric test
- - Wafer level reliability
- - Packaged device characterization
- - C-V/I-V characterization with the Model 4200-SCS control of an external LCR meter
- - High K gate charge trapping
- - Isothermal testing of devices and materials subject to self-heating effects
- - Charge pumping to characterize interface state densities in MOSFET devices
- - Resistive or capacitive MEMS drive characterization
- Optoelectronic Devices
- - Semiconductor laser diode DC/CW characterization
- - DC/CW characterization of transceiver modules
- - PIN and APD characterization
- Technology Development
- - Carbon nanotube characterization
- - Materials research
- - Electrochemistry
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RECHERCHE DE PRODUIT
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NUMÉRO D'APPEL
1-800-935-5595 (US Only)
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