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Documentation associée
Model 2410-C High-Voltage SourceMeter w/ Contact Check, Measurements up to 1100V and 1A, 20W Power Output
Manuels
Model 2410 1100V SourceMeter Service Manual Rev. B
Series 2400 SourceMeter User's Manual
Model 2400 SourceMeter Service Manual Rev. D
Model 2400 Series SourceMeter Japanese User's Manual Rev. A (12.2MB)
2400 Series SourceMeter Quick Start Guide
Spécifications
Models 2410 and 2410-C SourceMeter Specifications Rev. D
Models 2400, 2401, 2400-LV and 2400-C SourceMeter Specifications
Note d'application
#2058 High Voltage Component Production Testing with Two Model 2410 SourceMeter Units
#2154 Testing Devices with High Voltage and High Current
#2124 Production Testing of High Current Varistors with the 2430C 1kW Pulse SourceMeter
Word 6.0 File Discussing the Issues of Ohms Accuracy with the 2400 Series
Technical Note for SourceMeter Buffers and How to Get Up to 5000 Data Points Using the Two Buffers
2400 Series Timestamping Technical Note
Automatic Resistance Measurements on High Temperature Superconductors
Can I generate current (or voltage) pulses with model 2400 or other non-pulse mode SourceMeter?
Device Characterization Techniques Using Keithley SourceMeter Instruments with LabTracer Software
#2217 Trigger Synchronization of Multiple SourceMeter Instruments
DC Electrical Characterization of RF Power Transistors
#2208 Solutions for Production Testing of Connectors
How to Choose and Apply Source Measure Unit SMU Instruments
FAQ
Sweep: How do I configure the Model 2400 SourceMeter to perform a voltage sweep from LabVIEW (LV)?
Remote Operation: How can I program a SourceMeter Instrument to Measure Resistance?
Remote Operation: What Front Panel Settings are Required to use the VXIPnP drivers for SourceMeter?
Ohms: How can I measure electron mobility of a thin film?
Speed: What factors affect the speed of a SourceMeter?
Speed: How fast can the 2400 series output a pulse?
Ohms: What is AUTO or MANUAL mode when measuring Resistance with a 2400?
Feature: What is the Contact Check option of a Source Meter?
Compliance: Can the measurement range be different than the compliance range?
Compliance: What does it mean when the units for the compliance value blink on the front panel?
Compliance: What does it mean when the CMPL (compliance) blinks on the front panel?
Compliance: How do I change the compliance (CMPL) value?
Ohms: Which SourceMeter instrument do you recommend for four-point probe measurement techniques?
Amps: What is the Output Resistance for the Current Source of a SourceMeter?
Application Examples for SourceMeter Instruments
Amps: When using a SourceMeter to measure only (no sourcing), why is the current negative?
Sweep: Is it possible to send a command to the SourceMeter that will interrupt the sweep?
Sweep: Can I use an external trigger to stop a SourceMeter sweep?
Compliance: What is Compliance Voltage on the Source-Measure Units and SourceMeter instruments?
Remote Operation: What are VXIPnP Drivers?
Remote Operation: Can I use GPIB cards from Agilent with Keithley's Instrument Drivers?
Specs: What is Offset Compensation?
Ohms: How do you decide whether to use a two-probe method or a four-probe method for resistance?
Speed: What would be a good instrument to use to measure di/dt?
Specs: What is CMRR (Common Mode Rejection Ratio)?
Troubleshooting: How do I limit ground loops?
Specs: What are the effects on accuracy due to possible deterioration within calibration periods?
Speed: What is NPLC?
Journaux blancs
Telecom Test Equipment Must Meet Tight Space Demands While Providing High Throughput, Accuracy
Obtaining More Accurate Resistance Measurements Using the 6-Wire Ohms Measurement Technique
New Test Realities for Evolving FPD Technologies
Rapidly Expanding Array of Test Applications Continues to Drive Source Measurement Unit Instrument Technology (also Applicable to Series 2600B)
Fiches techniques produits
Series 2400 SourceMeter Line
Technical Information - Source Measurement Unit (SMU) Instruments
Brochures
Series 2400 SourceMeter Family
Source Measure Unit Instruments - The Tool of Choice for Emerging R&D Applications
Discover the Industry Standard for LED Electrical Test
Electrical Measurement of High Brightness LED Electrical E-Guide
E-Guide to Solving Today's Material and Device Characterization Challenges
Advances in Electrical Measurements for Nanotechnology E-Handbook
Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
Your Guide to Creating High Performance Switching Applications
E-Handbook Guide to Switch Considerations by Signal Type
Guides de sélection
Source and Measure Products Selector Guide
Articles
Combining the Benefits of LXI and Scripting
Handbook
Advances in Electrical Measurements for Nanotechnology
E-Guide to Solving Today's Material and Device Characterization Challenges