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Model ACS Basic Edition Automated Characterization Suite for Component Characterization

Part Number: ACSBasicEdition
Les prix en EURO indiqués sont valables pour les références produits achetés en ligne, exclusivement en France. Aucune ré-exportation n'est autorisée sans l'accord préalable écrit de Keithley Instruments.

Facilitez le test de vos cellules solaires avec les solutions de mesure haute précision Keithley


Key Features and Benefits:
  • Combine hardware from any of Keithley's SourceMeter® families into a single test, including Series 2600, 2600A, 2400, Model 4200-SCS, and Model 237 SMU
  • Take advantage of Ethernet communication with Series 2600A SourceMeter Instruments
  • Optimized for component test, verification, and analysis applications
  • No coding needed - ACS's intuitive GUI simplifies getting I-V tests, analysis, and results quickly
  • System flexibility - Add or remove instruments dynamically to meet individual test needs
  • Pre-existing application libraries - An incredibly rich set of quick and easy-to-access test libraries
  • Fast time to first measurements - Quickly select tests that work with the instruments you have and the devices you need to test
  • FREE optional off-line version makes it simple to develop new test sequences on another PC

Keithley developed ACS Basic Edition to maximize the productivity of technicians and engineers responsible for packaged part characterization in applications ranging from early device research through development, quality verification, and failure analysis. When paired with one or more of the instruments in Keithley’s broad range of proven SourceMeter® instruments, our new, easy-to-use ACS Basic Edition software delivers high precision, cost-effective solutions for component test. It is delivered complete with a comprehensive suite of parametric characterizations, so it can quickly and easily provide the results you need to verify a component's performance vs. its specifications, complete incoming inspection or quality assurance evaluations, or understand the electrical properties of novel devices or materials.

Related Applications:
  • Semiconductor product development based on existing mature processes
  • Incoming inspection and QA group
  • Research/investigation of novel devices